Project Period
December 2000- November 2003
Level of Access
Open-Access Report
Grant Number
0082973
Submission Date
9-11-2004
Abstract
This project, strengthening the microelectronics program in the Electrical and Computer Engineering Department (ECE), proposes to establish an electrical characterization and test laboratory which will provide the capability for measuring electrical properties of materials, devices, and circuits. Electrical test equipment for the measurement and characterization of dielectric materials, devices, and circuit components, will be acquired in order to provide students with hands-on experience in electrical measurements complementing the other labs in the ECE Department. In addition to providing training in microelectronics testing, the facility will allow for expanded research in the area of solid-state electronics. Focusing on material characterization, including thin films and novel gas-sensor, the project pursues the following objectives for the proposed lab:
Characterizing electronic thins films,
Enabling systematic characterization of novel devices including gas-sensors, and
Providing a state-of-the-art capability for testing custom-designed integrated circuits.
The amount of time needed to adequately test integrated circuits has been increasing with the greater level of integration in modern microelectronics. Continued increases in the density of the microelectronic circuits push against fundamental limits of device operation, driving the need for novel devices and new electronic materials. Hence, the microelectronic community should exhibit interest in a systematic approach to testing and characterization of new materials, devices, and circuits. Synergistic with existing programs at the University of Maine (e.g., sensor development, new materials development, and materials and device modeling), the project will contribute to strengthen the relationship between the ECE Department and the semiconductor industry in Maine, provide students with skills needed by these companies, and help forge relationships with research groups involved in electronic materials development.
Rights and Access Note
This Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. In addition, no permission is required from the rights-holder(s) for educational uses. For other uses, you need to obtain permission from the rights-holder(s).
Recommended Citation
Kotecki, David, "Electrical Characterization and Testing of Microelectronic Materials, Devices, and Circuits" (2004). University of Maine Office of Research Administration: Grant Reports. 75.
https://digitalcommons.library.umaine.edu/orsp_reports/75
Additional Participants
Graduate Student
Steven Turner
Fan Yang
Janelle Tonti
Undergraduate Student
Crystal Cote
Jason Reblin
Research Experience for Undergraduates
Crystal Carr
Alexander Traxlier
Piu Yu
Kyle Pierce
Other Collaborators
Rosemary Smith
Mauricio Pereira da Cunha